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                                                                          Kaifa(000021.SZ)
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                                                                          Test Technology

                                                                          Image Recognition Technology

                                                                          With the mature image recognition technology, Kaifa is capable of providing the core technical modules for the product testing and the design for testing devices:

                                                                          q Detection technology solution of barcodes/ label’s quality

                                                                          q Quality detection based on video capturing

                                                                          q Optical testing technology of PCBA components

                                                                                                   Optical testing for PCBA

                                                                          RF Test

                                                                          q GSM/GPRS/CDMA/LTEaaaa,2G/3G/4G, GPS

                                                                          q BT/BLEaaa,WiFiaaa,ZigBee module

                                                                          q NFCaaa,RFID


                                                                                                        2G/3G/4G Test                                                  BT/BLE Test

                                                                          Automatic Platform of Micron Level Testing

                                                                          Automatic high precision measuring platform for structure dimension is an independent developed platform, which can be introduced to fast customization of the online measuring and testing devices. 

                                                                          q Multiple axis automatic control system

                                                                          q Micron-level automatic optical location technology

                                                                          q Measuring and testing technology of micron angles etc.


                                                                                         Automatic Platform of Micron Level Testing